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Characterization of Micro-Structured Optical Arrays

Research output: Chapter in Book/Report/Conference proceedingConference paper

M. T. Shand, G. R. Morrison, A. G. Michette, S. J. Pfauntsch, D. Hart, T. Stevenson, W. Parkes, C. Dunare, R. Willingale, C. Feldman, T. Button, C. Meggs, D. Rodriguez-Sanmartin

Original languageEnglish
Title of host publicationUnknown
Place of PublicationMELVILLE
PublisherAmer Inst Physics
Pages453 - 456
Number of pages4
Volume1365
ISBN (Print)978-0-7354-0925-5
DOIs
Publication statusPublished - 2011
Event10th International Conference on X-ray Microscopy - Chicago, IL
Duration: 15 Aug 201020 Aug 2010

Publication series

Name10TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY

Conference

Conference10th International Conference on X-ray Microscopy
CityChicago, IL
Period15/08/201020/08/2010

King's Authors

Abstract

Characterization methods for grazing-incidence reflecting channel arrays are discussed. Characterization of single-reflection, unactuated micro-structured optical arrays is required to evaluate their performance as focusing elements. Numerical simulations allow the contribution of the x-rays reflected by the channel walls to be distinguished from the overall transmitted signal, and are applied to axial sources. Experimental results are also shown to support the simulations by translation of the channel structure parallel to a detector plane, allowing separation of reflected and transmitted x-rays through the array on the detector.

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