Confidence regions around the ridge of optimal response on fitted second-order response surfaces

TY - JOUR

T1 - Confidence regions around the ridge of optimal response on fitted second-order response surfaces

AU - Gilmour, Steven G.

AU - Draper, Norman R.

PY - 2003/11

Y1 - 2003/11

N2 - Ridge analysis is a technique useful in connection with the fitting of second-order response surfaces. It enables a path of maximum predicted ŷ values (maximum on a sphere of radius R) to be specified, and followed out from the origin of the experimental region, as R increases. (Alternatively, a minimum ŷ path can be followed out.) This article discusses the addition of a measure of uncertainty to the selected path, thus providing an assessment of the reliability of the ridge analysis as a path progresses. The utility of this method is illustrated by applications to two datasets.

AB - Ridge analysis is a technique useful in connection with the fitting of second-order response surfaces. It enables a path of maximum predicted ŷ values (maximum on a sphere of radius R) to be specified, and followed out from the origin of the experimental region, as R increases. (Alternatively, a minimum ŷ path can be followed out.) This article discusses the addition of a measure of uncertainty to the selected path, thus providing an assessment of the reliability of the ridge analysis as a path progresses. The utility of this method is illustrated by applications to two datasets.

KW - Ridge analysis

KW - Second-order surface

KW - Uncertainty of ridge paths

UR - http://www.scopus.com/inward/record.url?scp=0344236212&partnerID=8YFLogxK

U2 - 10.1198/004017003000000159

DO - 10.1198/004017003000000159

M3 - Article

AN - SCOPUS:0344236212

SN - 0040-1706

VL - 45

SP - 333

EP - 339

JO - TECHNOMETRICS

JF - TECHNOMETRICS

IS - 4

ER -