A configured detector system based on an 80x80 element x-ray sensitive CCD array has been developed to replace the conventional transmitted x-ray detector used in the scanning transmission x-ray microscope. This from of detector allows a flexible choice of imaging modes to be made simultaneously from only a single scan of the sample. Details of the theoretical benefits expected, and the hardware implementation, are described.
|Name||AIP CONFERENCE PROCEEDINGS|
|Conference||6th International Conference on X-Ray Microscopy|
|Period||1/01/2000 → …|