Determination of the evolution of layer thickness errors and interfacial imperfections in ultrathin sputtered Cr/C multilayers using high-resolution transmission electron microscopy

Hui Jiang, Alan Michette, Slawka Pfauntsch, Zhanshan Wang, Jingtao Zhu, Dehui Li

Research output: Contribution to journal › Article › peer-review

14 Citations (Scopus)

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