Abstract
We determine the effect of defects induced by ion bombardment on the Raman spectrum of single-layer molybdenum disulfide. The evolution of both the linewidths and frequency shifts of the first-order Raman bands with the density of defects is explained with a phonon confinement model, using density functional theory to calculate the phonon dispersion curves. We identify several defect-induced Raman scattering peaks arising from zone-edge phonon modes. Among these, the most prominent is the LA(M) peak at ∼227cm-1 and its intensity, relative to the one of first-order Raman bands, is found to be proportional to the density of defects. These results provide a practical route to quantify defects in single-layer Mo S2 using Raman spectroscopy and highlight an analogy between the LA(M) peak in Mo S2 and the D peak in graphene.
Original language | English |
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Article number | 195411 |
Number of pages | 7 |
Journal | Physical Review B (Condensed Matter and Materials Physics) |
Volume | 91 |
Issue number | 19 |
Early online date | 11 May 2015 |
DOIs | |
Publication status | Published - 15 May 2015 |