Effect of Stack Geometry on the Dynamic Resistance Threshold Fields for Vertical Stacks of Coated Conductor Tapes

Justin M. Brooks; Mark D. Ainslie; Rodney A. Badcock; Chris W. Bumby

doi:10.1109/TASC.2021.3059593

Effect of Stack Geometry on the Dynamic Resistance Threshold Fields for Vertical Stacks of Coated Conductor Tapes

Justin M. Brooks^*, Mark D. Ainslie, Rodney A. Badcock, Chris W. Bumby

^*Corresponding author for this work

Engineering

Robinson Research Institute, Victoria University of Wellington

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

The expanding capabilities of HTS flux pumps and rectifiers to provide kA+ currents necessitates the exploration of high-current switching phenomenon. One such phenomenon, the dynamic resistance, occurs in type-II devices carrying dc transport currents while exposed to ac magnetic fields. In the following, finite element analysis of the threshold field for dynamic resistance in superconducting cables comprised of N tapes connected in parallel and stacked vertically is presented. Cables are modelled using the commercial software COMSOL and the H-formulation. The models employ Ic(B, θ) and n(B, θ) data obtained on short samples at 77 K as inputs to more accurately reflect the variation in local properties within the superconductor. The finite element results are then compared with calculations made using analytical models assuming a critical state. The finite element data closely resembles that predicted for a strip for a single tape, rapidly tending towards the slab result as N increases.

Original language	English
Article number	9354958
Journal	IEEE Transactions on Applied Superconductivity
Volume	31
Issue number	5
DOIs	https://doi.org/10.1109/TASC.2021.3059593
Publication status	Published - 16 Feb 2021

Keywords

Dynamic resistance
H-formulation
HTS cables

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10.1109/TASC.2021.3059593

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title = "Effect of Stack Geometry on the Dynamic Resistance Threshold Fields for Vertical Stacks of Coated Conductor Tapes",

abstract = "The expanding capabilities of HTS flux pumps and rectifiers to provide kA+ currents necessitates the exploration of high-current switching phenomenon. One such phenomenon, the dynamic resistance, occurs in type-II devices carrying dc transport currents while exposed to ac magnetic fields. In the following, finite element analysis of the threshold field for dynamic resistance in superconducting cables comprised of N tapes connected in parallel and stacked vertically is presented. Cables are modelled using the commercial software COMSOL and the H-formulation. The models employ Ic(B, θ) and n(B, θ) data obtained on short samples at 77 K as inputs to more accurately reflect the variation in local properties within the superconductor. The finite element results are then compared with calculations made using analytical models assuming a critical state. The finite element data closely resembles that predicted for a strip for a single tape, rapidly tending towards the slab result as N increases.",

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note = "Funding Information: Manuscript received December 1, 2020; revised January 23, 2021; accepted January 28, 2021. Date of publication February 16, 2021; date of current version March 17, 2021. This work was supported in part by New Zealand MBIE Endeavour under Grant RTVU1707 and in part by NZ Royal Society Marsden under Grant MFP-VUW1806. The work of Justin M. Brooks was supported by the Victoria Doctoral Scholarship Scheme, and TeA tiHau Trust. The work of Mark D. Ainslie was supported by EPSRC Early Career Fellowship EP/ P020313/1. (Corresponding author: Justin M. Brooks.) Justin M. Brooks, Rodney A. Badcock, and Chris W. Bumby are with the Robinson Research Institute, Victoria University of Wellington, Lower Hutt 5046, New Zealand (e-mail: [email protected]). Publisher Copyright: {\textcopyright} 2002-2011 IEEE.",

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N2 - The expanding capabilities of HTS flux pumps and rectifiers to provide kA+ currents necessitates the exploration of high-current switching phenomenon. One such phenomenon, the dynamic resistance, occurs in type-II devices carrying dc transport currents while exposed to ac magnetic fields. In the following, finite element analysis of the threshold field for dynamic resistance in superconducting cables comprised of N tapes connected in parallel and stacked vertically is presented. Cables are modelled using the commercial software COMSOL and the H-formulation. The models employ Ic(B, θ) and n(B, θ) data obtained on short samples at 77 K as inputs to more accurately reflect the variation in local properties within the superconductor. The finite element results are then compared with calculations made using analytical models assuming a critical state. The finite element data closely resembles that predicted for a strip for a single tape, rapidly tending towards the slab result as N increases.

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Effect of Stack Geometry on the Dynamic Resistance Threshold Fields for Vertical Stacks of Coated Conductor Tapes

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