Abstract
Diamond has been identified as a very promising material for X and ultraviolet sensing. In this Letter, a photoconductive device based on a freestanding homoepitaxial chemically vapor deposition (CVD) single-crystal diamond 500 μ m thick has been tested. Photoconductive measurements in coplanar and transverse configurations have been performed to characterize the device sensitivity in the 140-250 nm spectral range. Very high sensitivity values were achieved in both configurations. The sensitivity in the transverse configuration is at least 300 times higher than in the coplanar configuration. © 2005 American Institute of Physics
Original language | English |
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Article number | 213504 |
Pages (from-to) | 1-3 |
Number of pages | 3 |
Journal | APPLIED PHYSICS LETTERS |
Volume | 86 |
Issue number | 21 |
Publication status | Published - 23 May 2005 |