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Finite element analysis of a wideband microwave tomography system for potential medical imaging

Research output: Chapter in Book/Report/Conference proceedingConference paper

Juan Córcoles, Pan Lu, Panagiotis Kosmas

Original languageEnglish
Title of host publication2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility, EMC Sapporo/APEMC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages358-361
Number of pages4
ISBN (Electronic)9784885523229
DOIs
Publication statusPublished - 1 Jun 2019
Event2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility, EMC Sapporo/APEMC 2019 - Sapporo, Japan
Duration: 3 Jun 20197 Jun 2019

Conference

Conference2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility, EMC Sapporo/APEMC 2019
CountryJapan
CitySapporo
Period3/06/20197/06/2019

King's Authors

Abstract

In this paper, we present two in-house finite element analysis methods for a wideband microwave tomography system setup. A hybrid vector three-dimensional (3D) formulation and a scalar two-dimensional (2D) formulation of the finite element method (FEM) for the forward model in microwave imaging are proposed. Simulations with dispersive materials of the system setup are performed in CST Microwave Studio and FEM formulations. We then compare the value of the S-parameters between the data from CST and FEM both in 3D and 2D, with the results showing a good agreement at different frequencies. To that end, we introduce a convenient calibration procedure to match the $S$-parameters and electric field values used in reconstruction algorithms.

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