Abstract
In finite state machine (FSM) based testing, the problem of fault masking in the unique input/output (UIO) sequence may degrade the test performance of the UIO based methods. This paper investigates this problem and proposes the use of a new type of unique input/output circuit (UIOC) sequence for state verification, which may help to overcome the drawbacks that exist in the UIO based techniques. When constructing a UIOC, overlap and internal state observation schema are used to increase the robustness of a test sequence. Test quality is compared by using the forward UIO method (F-method), the backward UIO method (B-method) and the UIOC method (C-method) separately. Robustness of the UIOCs constructed by the algorithm given in this paper is also compared with those constructed by the algorithm given previously. Experimental results suggest that the C-method outperforms the F- and the B-methods and the UIOCs constructed by the algorithm given in this paper, are more robust than those constructed by other proposed algorithms.
Original language | English |
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Pages (from-to) | 696 - 707 |
Number of pages | 12 |
Journal | INFORMATION AND SOFTWARE TECHNOLOGY |
Volume | 48 |
Issue number | 8 |
DOIs | |
Publication status | Published - Aug 2006 |