Abstract
We demonstrate a new method for obtaining sub-diffraction resolution in fluorescence microscopy. The technique involves the analysis of the time evolution of fluorescence images in the presence of weak and unstructured (fundamental Gaussian) continuous wave stimulated emission depletion. A reduced point spread functions (PSF) is obtained by the recombination of time segments of the evolving image. A significant reduction in the PSF for 20nm fluorescent beads (ca. 240nm to 125nm) is obtained with an on-sample power of 7.5mW (17MW/cm2) - substantially lower than that required for spatially structured stimulated emission depletion microscopy.
Original language | English |
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Pages (from-to) | 12327-12338 |
Number of pages | 12 |
Journal | OPTICS EXPRESS |
Volume | 22 |
Issue number | 10 |
DOIs | |
Publication status | Published - 2014 |