MILU: A Customizable, Runtime-Optimized Higher Order Mutation Testing Tool for the Full C Language

Yue Jia, Mark Harman

Research output: Chapter in Book/Report/Conference proceedingConference paper

136 Citations (Scopus)

Abstract

This paper introduces MILU, a C mutation testing tool designed for both first order and higher order mutation testing. All previous mutation testing tools apply all possible mutation operators to the program under test. By contrast, MILU allows customization of the set of mutation operators to be applied. To reduce runtime cost, MILU uses a novel 'test harness' technique to embed mutants and their associated test sets into a single-invocation procedure.
Original languageEnglish
Title of host publicationUnknown
Place of PublicationLOS ALAMITOS
PublisherIEEE COMPUTER SOC
Pages94 - 98
Number of pages5
ISBN (Print)978-0-7695-3383-4
Publication statusPublished - 2008
EventTesting - Academic and Industrial Conference 2008 - Windsor, ENGLAND
Duration: 29 Aug 200831 Aug 2008

Publication series

NameTACI PART 2008:TESTING: ACADEMIC AND INDUSTRIAL CONFERENCE PRACTICE AND RESEARCH TECHNIQUES, PROCEEDINGS

Conference

ConferenceTesting - Academic and Industrial Conference 2008
CityWindsor, ENGLAND
Period29/08/200831/08/2008

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