Abstract
The principles of magnetic domain image formation in second-harmonic near-field microscopy have been investigated in the case of in-plane magnetic anisotropy. Due to the electromagnetic interaction between a probe and a surface, magnetic contrast can be achieved by observing near-field intensity variations of the SH light for both polarizations of the fundamental light in the longitudinal and transverse illumination configurations without polarization analysis. Domains in thin ferromagnetic films of Ni and Co exhibiting in-plane magnetization have been imaged using the developed approach.
Original language | English |
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Pages (from-to) | 6341-6343 |
Number of pages | 3 |
Journal | APPLIED PHYSICS LETTERS |
Volume | 85 |
Issue number | 26 |
DOIs | |
Publication status | Published - 27 Dec 2004 |