Polycrystalline metal surfaces studied by X-ray photoelectron spectro-microscopy

A W Potts, G R Morrison, S R Khan, L Gregoratti, M Kiskinova

Research output: Chapter in Book/Report/Conference proceedingConference paper


The scanning photoelectron microscope (SPEM) on beam line 2.2 at the Elettra synchrotron produces small spot XPS spectra front a sub-micron radiation microprobe. It is also capable of producing surface images in terms of the energy resolved photoelectron signal. This microscope has been used to study oxidation on polycrystalline tin and lead surfaces and the variations in reactivity between different crystallite surfaces. The diffusion of gold and silver films on polycrystalline metal surfaces has also been followed.
Original languageEnglish
Title of host publicationAIP CONF PROC Vol. 507
Place of PublicationMELVILLE
PublisherAmer Inst Physics
Pages269 - 273
Number of pages5
ISBN (Print)1-56396-926-2
Publication statusPublished - 2000
Event6th International Conference on X-Ray Microscopy - BERKELEY, CALIFORNIA
Duration: 1 Jan 2000 → …

Publication series



Conference6th International Conference on X-Ray Microscopy
Period1/01/2000 → …


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