Probing individual point defects in graphene via near-field Raman scattering

TY - JOUR

T1 - Probing individual point defects in graphene via near-field Raman scattering

AU - Mignuzzi, Sandro

AU - Kumar, Naresh

AU - Brennan, Barry

AU - Gilmore, Ian S.

AU - Richards, David

AU - Pollard, Andrew J.

AU - Roy, Debdulal

PY - 2015/12/14

Y1 - 2015/12/14

N2 - The Raman scattering D-peak in graphene is spatially localised in close proximity to defects. Here, we demonstrate the capability of tip-enhanced Raman spectroscopy (TERS) to probe individual point defects, even for a graphene layer with an extremely low defect density. This is of practical interest for future graphene electronic devices. The measured TERS spectra enable a direct determination of the average inter-defect distance within the graphene sheet. Analysis of the TERS enhancement factor of the graphene Raman peaks highlights the preferential enhancement and symmetry-dependent selectivity of the D-peak intensity caused by zero-dimensional Raman scatterers.

AB - The Raman scattering D-peak in graphene is spatially localised in close proximity to defects. Here, we demonstrate the capability of tip-enhanced Raman spectroscopy (TERS) to probe individual point defects, even for a graphene layer with an extremely low defect density. This is of practical interest for future graphene electronic devices. The measured TERS spectra enable a direct determination of the average inter-defect distance within the graphene sheet. Analysis of the TERS enhancement factor of the graphene Raman peaks highlights the preferential enhancement and symmetry-dependent selectivity of the D-peak intensity caused by zero-dimensional Raman scatterers.

UR - http://www.scopus.com/inward/record.url?scp=84948146201&partnerID=8YFLogxK

U2 - 10.1039/c5nr04664e

DO - 10.1039/c5nr04664e

M3 - Article

AN - SCOPUS:84948146201

SN - 2040-3364

VL - 7

SP - 19413

EP - 19418

JO - Nanoscale

JF - Nanoscale

IS - 46

ER -