Superresolution by localization of quantum dots using blinking statistics

K A Lidke, B Rieger, T M Jovin, R Heintzmann

Research output: Contribution to journalArticlepeer-review

299 Citations (Scopus)

Abstract

In microscopy, single fluorescence point sources can be localized with a precision several times greater than the resolution limit of the microscope. We show that the intermittent fluorescence or 'blinking' of quantum dots can analyzed by an Independent Component Analysis so as to identify the light emitted by each individual nanoparticle, localize it precisely, and thereby resolve groups of closely spaced (
Original languageEnglish
Pages (from-to)7052 - 7062
Number of pages11
JournalOPTICS EXPRESS
Volume13
Issue number18
DOIs
Publication statusPublished - 5 Sept 2005

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