Test-retest reliability of ERP components of P300, P50, and duration mismatch negativity in monozygotic twins

M Hall, K Schulze, F Rijsdijk, M Picchioni, U Ettinger, E Bramon, R Freedman, R Murray, P Sham

Research output: Contribution to journal › Meeting abstract

Original language	English
Pages (from-to)	116 - 116
Number of pages	1
Journal	American Journal of Medical Genetics
Volume	130B
Issue number	1
Publication status	Published - 2004
Event	12th World Congress of Psychiatric Genetics - Dublin, Ireland Duration: 9 Oct 2004 → 13 Oct 2004

Cite this

@article{9433ea1d27194f5f80892f8447c74ada,

title = "Test-retest reliability of ERP components of P300, P50, and duration mismatch negativity in monozygotic twins",

author = "M Hall and K Schulze and F Rijsdijk and M Picchioni and U Ettinger and E Bramon and R Freedman and R Murray and P Sham",

year = "2004",

language = "English",

volume = "130B",

pages = "116 -- 116",

journal = "American Journal of Medical Genetics",

publisher = "Wiley-Liss Inc.",

number = "1",

note = "12th World Congress of Psychiatric Genetics ; Conference date: 09-10-2004 Through 13-10-2004",

}

TY - JOUR

T1 - Test-retest reliability of ERP components of P300, P50, and duration mismatch negativity in monozygotic twins

AU - Hall, M

AU - Schulze, K

AU - Rijsdijk, F

AU - Picchioni, M

AU - Ettinger, U

AU - Bramon, E

AU - Freedman, R

AU - Murray, R

AU - Sham, P

PY - 2004

Y1 - 2004

M3 - Meeting abstract

VL - 130B

SP - 116

EP - 116

JO - American Journal of Medical Genetics

JF - American Journal of Medical Genetics

IS - 1

T2 - 12th World Congress of Psychiatric Genetics

Y2 - 9 October 2004 through 13 October 2004

ER -