Test-retest reliability of ERP components of P300, P50 and duration mismatch negativity in monozygotic twins

M H Hall, K Schulze, P Sham, M Picchioni, U Ettinger, F Rijsdijk, E Bramon, R Freedman, R M Murray

Research output: Contribution to journal › Meeting abstract

Original language	English
Pages (from-to)	129 - 129
Number of pages	1
Journal	Schizophrenia Research
Volume	67
Issue number	1
Publication status	Published - 2004
Event	12th Biennial Winter Workshop on Schizophrenia - DAVOS, Switzerland Duration: 1 Jan 2004 → …

Cite this

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title = "Test-retest reliability of ERP components of P300, P50 and duration mismatch negativity in monozygotic twins",

author = "Hall, {M H} and K Schulze and P Sham and M Picchioni and U Ettinger and F Rijsdijk and E Bramon and R Freedman and Murray, {R M}",

year = "2004",

language = "English",

volume = "67",

pages = "129 -- 129",

journal = "Schizophrenia Research",

issn = "1573-2509",

publisher = "Elsevier",

number = "1",

note = "12th Biennial Winter Workshop on Schizophrenia ; Conference date: 01-01-2004",

}

TY - JOUR

T1 - Test-retest reliability of ERP components of P300, P50 and duration mismatch negativity in monozygotic twins

AU - Hall, M H

AU - Schulze, K

AU - Sham, P

AU - Picchioni, M

AU - Ettinger, U

AU - Rijsdijk, F

AU - Bramon, E

AU - Freedman, R

AU - Murray, R M

PY - 2004

Y1 - 2004

M3 - Meeting abstract

SN - 1573-2509

VL - 67

SP - 129

EP - 129

JO - Schizophrenia Research

JF - Schizophrenia Research

IS - 1

T2 - 12th Biennial Winter Workshop on Schizophrenia

Y2 - 1 January 2004

ER -