Sub-micrometer resolution has been achieved in photoemission microscopy thanks to the high flux and brightness of the soft X-rays provided by third generation synchrotron sources and the progress in microfabrication of focusing elements. The use of multichannel detectors in recently constructed scanning microscopes adds speed and flexibility in data acquisition. Here we present preliminary results on a study of the interactions between sub-monolayer Pd and polycrystalline Ni obtained with the scanning photoemission microscope at Elettra to illustrate the importance of multichannel data acquisition in photoemission microscopy.
|Pages (from-to)||705 - 708|
|Number of pages||4|
|Journal||SURFACE REVIEW AND LETTERS|
|Publication status||Published - Apr 2002|
|Event||13th International Conference on Vacuum Ultraviolet Radiation Physics (VUV-13) - TRIESTE, Italy|
Duration: 1 Jan 2002 → …