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The Measurement of MTFs in X-ray Microscopy Using Diffractograms

Research output: Chapter in Book/Report/Conference proceedingConference paper

Original languageEnglish
Title of host publicationUnknown
Place of PublicationMELVILLE
PublisherAmer Inst Physics
Pages273 - 276
Number of pages4
Volume1365
ISBN (Print)978-0-7354-0925-5
DOIs
Publication statusPublished - 2011
Event10th International Conference on X-ray Microscopy - Chicago, IL
Duration: 15 Aug 201020 Aug 2010

Publication series

Name10TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY

Conference

Conference10th International Conference on X-ray Microscopy
CityChicago, IL
Period15/08/201020/08/2010

King's Authors

Abstract

A novel method to characterize the optical performance of a high-resolution transmission x-ray microscope is presented. It makes use of test patterns that consist of random arrays of sub-resolution holes in a thin metal film, and so approximate to white-noise input signals for the microscope. The test patterns have been fabricated by electron-beam lithography at length scales appropriate for the resolution available in x-ray microscopy, so that diffractograms produced from the image data can be directly interpreted in terms of the contrast transfer function of the optical system. Results of this method are shown for both brightfield and differential phase contrast imaging.

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