Theory of spin loss at metallic interfaces

K. D. Belashchenko*, Alexey A. Kovalev, M. Van Schilfgaarde

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

46 Citations (Scopus)
167 Downloads (Pure)

Abstract

Interfacial spin-flip scattering plays an important role in magnetoelectronic devices. Spin loss at metallic interfaces is usually quantified by matching the magnetoresistance data for multilayers to the Valet-Fert model, while treating each interface as a fictitious bulk layer whose thickness is δ times the spin-diffusion length. By employing the properly generalized circuit theory and the scattering matrix approaches, we derive the relation of the parameter δ to the spin-flip transmission and reflection probabilities at an individual interface. It is found that δ is proportional to the square root of the probability of spin-flip scattering. We calculate the spin-flip scattering probabilities for flat and rough Cu/Pd interfaces using the Landauer-Büttiker method based on the first-principles electronic structure and find δ to be in reasonable agreement with experiment.

Original languageEnglish
Article number207204
Number of pages6
JournalPhysical Review Letters
Volume117
Issue number20
DOIs
Publication statusPublished - 10 Nov 2016

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