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Abstract
Interfacial spin-flip scattering plays an important role in magnetoelectronic devices. Spin loss at metallic interfaces is usually quantified by matching the magnetoresistance data for multilayers to the Valet-Fert model, while treating each interface as a fictitious bulk layer whose thickness is δ times the spin-diffusion length. By employing the properly generalized circuit theory and the scattering matrix approaches, we derive the relation of the parameter δ to the spin-flip transmission and reflection probabilities at an individual interface. It is found that δ is proportional to the square root of the probability of spin-flip scattering. We calculate the spin-flip scattering probabilities for flat and rough Cu/Pd interfaces using the Landauer-Büttiker method based on the first-principles electronic structure and find δ to be in reasonable agreement with experiment.
Original language | English |
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Article number | 207204 |
Number of pages | 6 |
Journal | Physical Review Letters |
Volume | 117 |
Issue number | 20 |
DOIs | |
Publication status | Published - 10 Nov 2016 |
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