Tumour Margin Thickness Inference for 99mTc Radioguided Surgery Using Internal Conversion Electrons

Joshua Moo; Andrew Reader; Paul Marsden; Kunal Vyas

doi:10.1109/NSS/MIC/RTSD57108.2024.10657746

Tumour Margin Thickness Inference for 99mTc Radioguided Surgery Using Internal Conversion Electrons

Joshua Moo, Andrew Reader, Paul Marsden, Kunal Vyas

Lightpoint Medical Ltd.

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), Tampa, FL, USA
DOIs	https://doi.org/10.1109/NSS/MIC/RTSD57108.2024.10657746
Publication status	Published - 25 Sept 2024

Access to Document

10.1109/NSS/MIC/RTSD57108.2024.10657746

Cite this

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title = "Tumour Margin Thickness Inference for 99mTc Radioguided Surgery Using Internal Conversion Electrons",

author = "Joshua Moo and Andrew Reader and Paul Marsden and Kunal Vyas",

year = "2024",

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doi = "10.1109/NSS/MIC/RTSD57108.2024.10657746",

language = "English",

booktitle = "IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), Tampa, FL, USA",

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Tumour Margin Thickness Inference for 99mTc Radioguided Surgery Using Internal Conversion Electrons. / Moo, Joshua ; Reader, Andrew ; Marsden, Paul et al.
IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), Tampa, FL, USA. 2024.

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

TY - CHAP

T1 - Tumour Margin Thickness Inference for 99mTc Radioguided Surgery Using Internal Conversion Electrons

AU - Moo, Joshua

AU - Reader, Andrew

AU - Marsden, Paul

AU - Vyas, Kunal

PY - 2024/9/25

Y1 - 2024/9/25

U2 - 10.1109/NSS/MIC/RTSD57108.2024.10657746

DO - 10.1109/NSS/MIC/RTSD57108.2024.10657746

M3 - Conference paper

BT - IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), Tampa, FL, USA

ER -