TY - JOUR
T1 - Wide-field TCSPC-based fluorescence lifetime imaging (FLIM) microscopy
AU - Suhling, Klaus
AU - Hirvonen, Liisa Maija
AU - Becker, Wolfgang
AU - Smietana, Stefan
AU - Netz, Holger
AU - Milnes, James
AU - Conneely, Thomas
AU - Le Marois, Alix Marie
AU - Jagutzki, Ottmar
PY - 2016/5/5
Y1 - 2016/5/5
N2 - Time-correlated single photon counting (TCSPC) is a widely used, sensitive, precise, robust and mature technique to measure photon arrival times in applications such as fluorescence spectroscopy and microscopy, light detection and ranging (lidar) and optical tomography. Wide-field TCSPC detection techniques, where the position and the arrival time of the photons are recorded simultaneously, have seen several advances in the last few years, from the microsecond to the picosecond time scale. Here, we summarise some of our recent work in this field with emphasis on microsecond resolution phosphorescence lifetime imaging (PLIM) and nanosecond fluorescence lifetime imaging (FLIM) microscopy. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).
AB - Time-correlated single photon counting (TCSPC) is a widely used, sensitive, precise, robust and mature technique to measure photon arrival times in applications such as fluorescence spectroscopy and microscopy, light detection and ranging (lidar) and optical tomography. Wide-field TCSPC detection techniques, where the position and the arrival time of the photons are recorded simultaneously, have seen several advances in the last few years, from the microsecond to the picosecond time scale. Here, we summarise some of our recent work in this field with emphasis on microsecond resolution phosphorescence lifetime imaging (PLIM) and nanosecond fluorescence lifetime imaging (FLIM) microscopy. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).
U2 - 10.1117/12.2227198
DO - 10.1117/12.2227198
M3 - Conference paper
SN - 0277-786X
VL - 9858
JO - PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
JF - PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
M1 - 98580I
ER -